NC-AFM2006
9th International Conference on Non-Contact
Atomic Force Microscopy
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NC-AFM20069th International Conference on Non-Contact
Atomic Force Microscopy
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| WELCOME TO THE NC-AFM2006 WEB SITE ! |
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Conference Schedule and Programs
(SPM Roadmap,
Oral,
Poster Session) |
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| hour | Sun. 16, July | Mon. 17, July | Tue. 18, July | Wed. 19, July | Thu. 20, July |
| 8:30 | Registration | Registration | Registration | Registration | |
| 9:00 | Opening Remarks | Instrumentation and techniques I | Tip-sample interaction and atomic distinction I | Atomic scale manipulation and assembly of nanostructures I | |
| 9:20 | Atomic resolution imaging on molecular system I | ||||
| 10:20 | Coffee Break | Coffee Break | Coffee Break | Coffee Break | |
| 10:50 | Atomic resolution imaging on molecular system II | Instrumentation and techniques II | |||
| 11:00 | Registration (11:00-13:00) |
Tip-sample interaction and atomic distinction II | Atomic scale manipulation and assembly of nanostructures II | ||
| 11:40 | Closing Remarks | ||||
| 11:50 | Lunch on your own (11:50-13:30) |
Lunch on your own (11:50-13:30) |
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| 12:00 | Lunch on your own (12:00-13:40) |
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| 12:45 | Awarding Ceremony | ||||
| 13:00 | Special Session on "SPM Roadmap" (13:00-17:40) Registration (15:00-16:30 & 17:00-18:00(at the entrance of Welcome party) |
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| 13:30 | Imaging biological molecules under various conditions I | Measuring nanoscale magnetic and electronic properties I | |||
| 13:40 | Atomic resolution imaging on insulators and oxides I | ||||
| 14:30 | Coffee break | Coffee break | |||
| 14:40 | Coffee break | ||||
| 15:00 | Imaging biological molecules under various conditions II | Measuring nanoscale magnetic and electronic properties II | |||
| 15:20 | Atomic resolution imaging on insulators and oxides II | ||||
| 16:20 | Poster Session I [Coffee Service] (16:20-18:20) |
Poster Session II [Coffee Service] (16:20-18:20) |
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| 17:00 | |||||
| 17:30 | Welcome Party at Quality Hotel 2F "Valencia" (17:30-19:00) |
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| 18:00 | Banquet at Portpia Hote South Wing 1F "Ohwada" (18:00-20:00) |
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| 18:20 | |||||
| 19:00 | |||||
| 20:00 |
Special Session on "SPM Roadmap" (Sun. 16, July)| hour | contents | ||
| 13:00-13:15 | SPM Roadmaps | Seizo Morita | 15 min |
| 13:15-13:40 | STM | Masahiko Tomitori | 5 min |
| AFM | Yasuhiro Sugawara | 5 min | |
| NSOM | Toshiharu Saiki | 5 min | |
| Discussion | 10 min | ||
| 13:40-14:05 | Electric Force Microscopes | Masakazu Nakamura | 5 min |
| Capacitance Microscopes | Yoshitugu Nakagawa | 5 min | |
| Dielectric Microscopes | Yasuo Cho | 5 min | |
| Discussion | 10 min | ||
| 14:05-14:35 | Coffee Break | 30 min | |
| 14:35-15:00 | Nanotube Tips | Masamichi Yoshimura | 5 min |
| DFM in Liquids | Hirofumi Yamada | 5 min | |
| High-speed AFM | Toshio Ando | 5 min | |
| Discussion | 10 min | ||
| 15:00-15:40 | Application to Biomaterials | Atsushi Ikai | 5 min |
| Application to Polymers | Ken Nakajima | 5 min | |
| Application to Molecules | Shukichi Tanaka | 5 min | |
| Application to Catalysts | Hiroshi Onishi | 5 min | |
| Application to Semiconductor Devices | Koji Usuda | 5 min | |
| Discussion | 15 min | ||
| 15:40-16:10 | Coffee Break | 30 min | |
| 16:10-16:35 | SPM Theories | Masaru Tsukada | 20 min |
| Discussion | 5 min | ||
| 16:35-17:15 | Roadmap for nano-metrology | Isao Kojima | 15 min |
| SPM in Global Standards | Daisuke Fujita | 15 min | |
| Discussion | 10 min | ||
| 17:15-17:40 | General Discussion | 25 min | |
Atomic resolution imaging on molecular system
I, II (Mon. 17, July)| No. | hour | name | title |
| Mo-1 | 9:20-9:40 | Christian Loppacher | Self-assembly of alkyl phosphonic acids on mica and graphite |
| Mo-2 | 9:40-10:00 | Jeffrey M. Mativetsky | High Resolution NC-AFM of PTCDA Molecules on Nanostructured KBr |
| Mo-3 | 10:00-10:20 | Takashi Ichii | Submolecular-scale Studies on Metal-phthalocyanine Ultrathin Films using NC-AFM and Its Related Techniques |
| Mo-4 | 10:50-11:10 | Shukichi Tanaka | FM-NCAFM Investigation of Individual Organic Molecules on Insulating Substrates |
| Mo-5 | 11:10-11:30 | Kingo Itaya | Surface Structures of Pentacene Thin Films Using NC-AFM |
| Mo-6 | 11:30-11:50 | Masanori Harada | Theoretical investigation of AFM image resolution of organic molecules |
Imaging biological molecules under various
conditions I, II (Mon. 17, July)| No. | hour | name | title |
| Mo-7 | 13:30-13:50 | Hirofumi Yamada | Subnanometer-resolution Imaging of Molecules in Liquid by FM-AFM |
| Mo-8 | 13:50-14:10 | Jaime Colchero | From low oscillation to "no" oscillation dynamic NC-SFM in air |
| Mo-9 | 14:10-14:30 | Takeshi Fukuma | Molecular Resolution Imaging of Lipid Bilayers in Liquid by Frequency Modulation Atomic Force Microscopy |
| Mo-10 | 15:00-15:20 | Hendrik Hölscher | Measurement of Contour Maps of Tip-Sample Interactions on DPPC and Single Stranded DNA by Dynamic Force Spectroscopy in Air |
| Mo-11 | 15:20-15:40 | Toshio Ando | Rapid Scan Atomic Force Microscopy |
| Mo-12 | 15:40-16:00 | Bart W. Hoogenboom | Frequency-modulation scanning force microscopy for biology |
| Mo-13 | 16:00-16:20 | Giovanni Di Santo | High resolution imaging of DNA at RT and LT: from Contact to AM-AFM |
Instrumentation and techniques I, II (Tue. 18, July)| No. | hour | name | title |
| Tu-1 | 9:00-9:20 | Hendrik Hölscher | The quest for high resolution in air and liquids: The role of tip-sample forces in Q-controlled force microscopy |
| Tu-2 | 9:20-9:40 | Ryusuke Hirose | Simultaneous observation of dielectric properties and tunneling current using non-contact scanning nonlinear dielectric microscopy |
| Tu-3 | 9:40-10:00 | Daiko Takamatsu | Photoswitching single-molecular tip for chemical analysis by NC-AFM |
| Tu-4 | 10:00-10:20 | Toshu An | Atomically-Resolved Imaging by Low Temperature-FM-AFM using a Quartz Length-Extension Resonator |
| Tu-5 | 10:50-11:10 | Takuya Matsumoto | Time-resolved scanning force microscopy |
| Tu-6 | 11:10-11:30 | Shigeki Kawai | Small amplitude dynamic force microscopy operating at 4.7 MHz |
| Tu-7 | 11:30-11:50 | Masayuki Abe | Feed-forward acquisition mode for imaging, force spectroscopy and potential mapping at room temperature |
Measuring nanoscale magnetic and electronic
properties I, II (Tue. 18, July)| No. | hour | name | title |
| Tu-8 | 13:30-13:50 | Alexander Schwarz | Magnetic Exchange Force Microscopy |
| Tu-9 | 13:50-14:10 | Thilo R. Glatzel | Kelvin Probe Force Microscopy - Limits of Resolution |
| Tu-10 | 14:10-14:30 | Rene Schmidt | Hydrogen-altered Gd(0001) surfaces investigated by dynamic force microscopy |
| Tu-11 | 15:00-15:20 | Toyoko Arai | Spectroscopic study of chemical resonating states by bias voltage nc-AFM/S |
| Tu-12 | 15:20-15:40 | Yasuo Azuma | Coulomb Blockade Phenomena Observed by Noncontact Atomic-Force Spectroscopy |
| Tu-13 | 15:40-16:00 | Hikaru Nomura | Charge distributuion measurement on CaF2(111)/Si(111) surface by electostatic force imaging |
| Tu-14 | 16:00-16:20 | Masashi Ishii | Photon introduction to electrostatic force microscope for nano-spectroscopy |
Tip-sample interaction and atomic distinction
I, II (Wed. 19, July)| No. | hour | name | title |
| We-1 | 9:00-9:20 | Yoshitaka Naitoh | Influence of surface stress on the phase change in Si(001) step measured by NC-AFM at 5K |
| We-2 | 9:20-9:40 | Yasuhiro Sugawara | The Origin of Anomalous Dissipation Contrast on Si(001) Surface at 5K |
| We-3 | 9:40-10:00 | Lev Kantorovich | Probing the Si(001) surface with a Si tip: an ab initio study |
| We-4 | 10:00-10:20 | Óscar Custance | Force Spectroscopy: a tool for single-atom chemical recognition at semiconductors |
| We-5 | 11:00-11:20 | Pablo Bell Pou | Chemical force and tip-surface elasticity: understanding the short-range force curves in atomic resolution dynamic force microscopy |
| We-6 | 11:20-11:40 | Yoshihide Seino | Distinction of intermixed ionic atoms on insulating surface of (Ca,Sr)F2 |
| We-7 | 11:40-12:00 | Olli Pakarinen | Chemical specificity and defect characterization on MgO(001) |
Atomic resolution imaging on insulators and
oxides I II (Wed. 19, July)| No. | hour | name | title |
| We-8 | 13:40-14:00 | Sabine Maier | Heteroepitaxial growth of NaCl and KBr |
| We-9 | 14:00-14:20 | Regina Hoffmann | Simulations of a KBr cluster with two possible states in a double-well potential |
| We-10 | 14:20-14:40 | Sebastian Gritschneder | Order and Complexity in the Surface Structure of Alumina on Ni3Al(111) |
| We-11 | 15:20-15:40 | Markus Heyde | Frequency modulated atomic force microscopy on MgO(001) thin films: Atomic resolution and site dependent short-range interaction forces |
| We-12 | 15:40-16:00 | Akira Sasahara | Kelvin probe force microscope analysis of Pt clusters on TiO2 surface |
| We-13 | 16:00-16:20 | Jeppe V. Lauritsen | Point defect and adsorbate identification on TiO2(110) by nc-AFM |
| We-14 | 16:20-16:40 | Franz J. Gieesibl | Subatomic resolution of the front atom of a metallic AFM tip by CO molecules on Cu(111) |
| We-15 | 16:40-17:00 | Markus Maier | Atomic resolution AFM on NaCl at 5 K using the QPlus sensor |
Atomic scale manipulation and assembly of
nanostructures I, II (Thu. 20, July)| No. | hour | name | title |
| Th-1 | 9:00-9:20 | Yoshiaki Sugimoto | Interchange vertical manipulation of single atoms and nanostructuring |
| Th-2 | 9:20-9:40 | Pavel Jelinek | Atomic pathways during the manipulation of single atoms at semiconductor surfaces using NC-AFM |
| Th-3 | 9:40-10:00 | Ivan Štich | Sn, Ge adatom exchange on Ge(111)-c(2x8): true lateral manipulation? |
| Th-4 | 10:00-10:20 | Sabine Hirth | The mechanism of force controlled lateral manipulation of atomic size defects on CaF2(111) |
| Th-5 | 11:00-11:20 | Thomas Trevethan | Simulations of controlled single atom manipulation in insulating surfaces |
| Th-6 | 11:20-11:40 | Lars A Zimmerli | Formation of Molecular Wires on KBr Nanostructures |
Poster Session I (Mon. 17, July)| Instrumentation and techniques | ||
| No | name | title |
| P1-1 | Keiichi Hayashi | "Van der Pol" Self-excited Microcantilever with PZT Actuator and Sensor |
| P1-2 | Makoto Endo | Scanning Nonlinear Magnetic Microscopy |
| P1-3 | Kenya Ishikawa | Scanning Nonlinear Dielectric Microscope using Electro-Conductive Carbon Nanotube Probe Tip |
| P1-4 | Minhwan Lee | Geometric artifact suppressed surface potential measurement |
| P1-5 | Nobuo Satoh | Dynamic Force Microscopy using Dissipative Force Modulation for Near-field Light Detection |
| P1-6 | Dong-Yeon Lee | Design of a Tip-scanning Head for an Atomic Force Microscope |
| P1-7 | S. Torbrügge | AFM Investigation of Precision-Machined Technical Fluorite Surfaces |
| P1-8 | Shigeki Kawai | Atomically resolved amplitude modulation dynamic force microscopy with a high resonance and quality factor cantilever |
| P1-9 | Lutz Tröger | Optimum excitation and detection of cantilever oscillation in vacuum |
| P1-10 | Kenjiro Kimura | 2D carrier profiling on operating Si-MOSFET by SCFM and SCM |
| P1-11 | Yutaka Miyatake | Low-Temperature AFM using self-detective Cantilever |
| P1-12 | Mehrdad Atabak | Quantitative imaging of lateral stiffness using sub-Angstrom oscillation amplitude nc-AFM |
| P1-13 | Eika Tsunemi | Development of a multi-probe AFM system with self-sensing cantilevers |
| P1-14 | Koichiro Honda | Visualization of charges localized in the thin gate film of MONOS type Flash memory using the SNDM |
| Atomic resolution imaging on molecular systems | ||
| No | name | title |
| P1-15 | Kingo Itaya | Structures of Single-Crystals of Orhganic Semiconductors |
| P1-16 | Matthew B Watkins | Molecular manipulation on metal oxide surfaces: theoretical predictions |
| P1-17 | Masatoshi Ikeda | SPM Observation of Ru(II) Complexes on Rutile TiO2(110) |
| P1-18 | Shin-ichi Yamamoto | Scanning Conductive Probe Microscopy of Pyrrole Molecules Incorporated into Chemically Adsorbed Monolayer |
| Highest resolution imaging on bio-molecules | ||
| No | name | title |
| P1-20 | Susana Tobenas | Influence of the substrate when imaging DNA in amplitude modulation-AFM |
| P1-21 | Takashi Horiuchi | Development of low-noise deflection sensor for FM-AFM and its application to biological imaging |
| Characterization and modification of force microscopy tips at the atomic scale | ||
| No | name | title |
| P1-22 | Hiroaki Azehara | Force Measurements with Chemically Defined Carbon Nanotube Tips |
| P1-23 | Zubaida A. Ansari | AFM Si tip with Ge clusters with capability of remolding by heating |
| Measuring tip-sample interaction potentials and mapping force fields | ||
| No | name | title |
| P1-24 | Shin-ichi Yamamoto | Potential Imaging of ferritin with Fe nano-particles by Kelvin Probe Force Microscope |
| P1-25 | Tobias Kunstmann | Force spectroscopy on PTCDA grown on KBr(001) |
| P1-26 | Manhee Lee | Confinement-Induced Phase Transition of Water |
| P1-27 | Manhee Lee | Formation, Manipulation, and Elasticity Measurement of a Nanometric Column of Water Molecules |
| P1-28 | Yu-Shiu Lo | Specific Interactions between Dopamine and Dopamine Receptors Studied by Atomic Force Microscopy |
| P1-29 | Takashi Namikawa | Tip-surface interaction potential mapping at room-temperature using non-contact atomic force microscopy |
| P1-30 | Osamu Kubo | Atomic force variations on composite systems based on single-walled carbon nanotubes |
| Mechanisms for damping and energy dissipation | ||
| No | name | title |
| P1-32 | Markus Fendrich | Molecular resolution in dissipation: PTCDA grown on KBr(001) |
| P1-34 | Jin-Ye Wang | Atomic Force Microscope Observation on Biomembrance before and After Peroxidation |
| P1-35 | Tsutomu Sonoda | An AFM Study on the Surface Structure of TiN/Ti Multi-Layered Films Deposited onto Ti-Based Alloy Substrates by Magnetron Sputtering |
| P1-36 | Michal Jerzy Wozniak | Application of the Phase Imaging and Force Modulation Mode for Description of Dispersion of Carbon Nanotubes in Polyol Matrix |
| P1-37 | Massimiliano Labardi | Stability of dynamic force microscopy in the self-oscillator mode |
| P1-38 | Massimiliano Labardi | Non-contact friction force microscopy based on quartz tuning fork sensors |
| P1-39 | Shuhei Nishida | Atomic Resolution Imaging in Water with the Second Flexural Mode using Optical excitation and Doppler velocimetry |
Poster Session II (Tue. 18, July)| Atomic resolution imaging on insulating substrates, semiconductors, and metals | ||
| No | name | title |
| P2-1 | Yoshitaka Naitoh | The origin of p(2x1) phase on Si(001) surface by NC-AFM at 5 K |
| P2-2 | Yoshimichi Namai | NC-AFM observations of atomic scale structures of TiO2(110) surface prepared under the atmosphere |
| P2-3 | Shota Yoshikawa | Simultaneous NC-AFM imaging of SrF2 and Si(111) surfaces |
| P2-4 | Toshitaka Kubo | NC-AFM and STM studies on the rutile TiO2(011) surface |
| P2-5 | Mona C. Christensen | Atomic-scale Investigation of hydroxylation-effects on Al2O3(0001) surfaces |
| P2-6 | Sebastian Gritschneder | Surface Chemistry of CeO2(111) Revealed by Dynamic Force Microscopy |
| P2-7 | Atsushi Ishiyama | High-resolution imaging and manipulation on KBr(100) at low temperature |
| P2-8 | Akihiro Ohiso | Thermal vs. tip-induced movement of substitutional Pb adatoms at the Ge(111)-c(2x8) surface |
| P2-9 | Akihira Miyachi | Observation of chalcogenide material surface for phase change memory (PRAM) using NC-AFM |
| P2-10 | Shintaro Fujii | Creating and imaging defects on CaF2(111) with non-contact atomic force microscopy |
| P2-11 | Özgur H. Özer | Simultaneous measurement of force gradient, topography, tunnel current and barrier height with sub-Angstrom amplitudes |
| P2-12 | Simon J. O'Brien | Ultra-low amplitude AFM/STM of rutile TiO2(110): simultaneous measurement of tunnelling, force-gradient, barrier-height and phase |
| P2-13 | Insook Yi | NC-AFM study on atomic structure of Ge clusters on Si(111)-(7x7) |
| Atomic scale manipulation and assembly of nanostructures | ||
| No | name | title |
| P2-14 | Kuniko Kimura | Alignment technique for polymer molecules using AFM with constant dynamic friction force |
| P2-15 | Ramsés V. Martínez | Nanolithography Based on the Formation and Manipulation of Nanometer-size Liquid Menisci by amplitude modulation AFM |
| P2-16 | Natalia Martsinovich | Theory of Manipulation of C60 on the Si(001) Surface |
| P2-17 | Hikaru Sano | Surface potential microscopy for photochemical degradation of self-assembled hexadecyl monolayers on silicon |
| P2-18 | Shigeki Kawai | Atom manipulation on the Si(111)-(7x7) surface with small amplitude dynamic force microscopy operating at room temperature |
| P2-19 | Ryuji Nishi | Lateral manipulation of single atomic defect on ionic crystal surface |
| Imaging and spectroscopy in liquid environment | ||
| No | name | title |
| P2-20 | Takaharu Okajima | Thermal fluctuation spectroscopy of living cell surfaces with AFM |
| P2-21 | Masami Kageshima | Measuring viscoelastic response of single biomolecule under forced unfolding process |
| P2-22 | Ken Nakajima | Single polymer chain viscosity investigated by dynamic force spectroscopy |
| P2-23 | Takeshi Fukuma | Influence of Contamination from Cantilever Coatings on Atomic Force Microscopy Experiments in Aqueous Environments |
| P2-24 | Atsushi Ikai | Bond Disruption in a Series of Non-Covalently Associated Biological Components |
| P2-25 | Yoshihiro Aburaya | Photoisomerization-Based Hydrophilicity/Hydrophobicity Control of AFM Probe toward Detection of Surface Polarization |
| Measuring nanoscale charges, work function, and magnetic properties | ||
| No | name | title |
| P2-26 | AnnaMaria Cucolo | Low temperature MFM experiments on La0.7Ca0.3MnO3-d films |
| P2-27 | Fumihiko Yamada | Surface Potential Microscopy of Adsorbates on Insulating Materials: Imaging and Modeling |
| P2-28 | Kumiko Hiehata | The local work function of a Pt/TiO2 photocatalyst probed by Kelvin force microscopy |
| P2-29 | Yuji Miyato | Surface Potential Measurements of SWNTs by FM-KFM |
| P2-30 | Ulrich Zerweck | Photovoltage measurement by means of Kelvin probe force microscopy |
| P2-31 | Kenichiro Kawasaki | Electrostatic Force Spectroscopy on Insulating Surface CaF2(111)/Si(111) by using NC-AFM |
| P2-32 | Taichi Nishio | Control of device characteristics of carbon nanotube field-effect transistors with locally polarized domains of P (VDF/TrFE) thin film |
| P2-33 | Masaru Kishida | Carbon Nanotube Tip Coated One-sidedly with Magnetic Materials for Magnetic Force Microscopy |
| P2-34 | Leo Merz | Influence of water adsorption on contact potential differences (CPDs) |
| Theoretical analysis of contrast mechanisms | ||
| No | name | title |
| P2-35 | Takuya Iida | Theoretical Study of the Resonant-Light-Induced Force Microscopy |
| P2-36 | Hendrik Hölscher | Simulation of Non-Contact Atomic Force Microscopy of Ag(110) |
| P2-37 | Matthew B. Watkins | Defect chemistry on Ceria (111) surfaces: experiment and theory |
| Simulation of images and virtual SFM systems | ||
| No | name | title |
| P2-39 | Naruo Sasaki | Effect of Tip Size on Chaos in Dynamic Atomic Force Microscopy |
| P2-40 | Akira Masago | NC-AFM simulations on methyl-terminated Si(100)2x1 surfaces |
| P2-41 | Katsunori Tagami | Simulated nc-AFM images of alcohol molecule in alkane SAM |
| P2-42 | Alexandros Kalampokidis | Modelling of NC-AFM imaging of alkanethiols on Au(111) |
| Tapping mode versus non-contact mode imaging | ||
| No | name | title |
| P2-43 | Tianwei Jing | High resolution non contact AFM study with MAC ModeTM |
| P2-44 | Ing-Shouh Hwang | Imaging of Soft Matters with Tapping-Mode AFM and NC-AFM |
| P2-45 | Naritaka Kobayashi | High-sensitive phase modulation AFM (PM-AFM) |
Program and Conference Schedule