Atomic Force Microscopy (AFM) is a unique
and very versatile scanning probe microscopy
based on a mechanical detection method. The
Non-Contact Atomic Force Microscopy (NC-AFM)
- one of the several AFM implementations
- is a highly-sensitive and high-resolution
technique with which the following feats
have been achieved:
The special characteristics of NC-AFM
have been only reached in ultra-high vacuum
environment, however molecular and sub-molecular
resolution is now also possible even in liquid
environment as well as ambient conditions.
- True atomic resolution in metal, semiconductor
and insulating surfaces.
- The measurement of atomic forces, so-called
atomic force spectroscopy.
- The chemical identification of atoms and
- The measurement of the mechanical response
of single atoms and molecules.
- The mechanical manipulation of individual
- Mechanical assembly and artificial nanostructuring
atom by atom.
Topics of the conference are:
- Instrumentation and techniques
- Atomic resolution imaging on insulating substrates, semiconductors, and metals
- Atomic resolution imaging on molecular systems
- Highest resolution imaging on bio-molecules
- Atomic scale manipulation and assembly of nanostructures
- Imaging and spectroscopy in liquid environment
- Theoretical analysis of contrast mechanisms
- Measuring tip-sample interaction potentials and mapping force fields
- Characterization and modification of force microscopy tips at the atomic scale
- Mechanisms for damping and energy dissipation
- Measuring nanoscale charges, work function, and magnetic properties
- Simulation of images and virtual SFM systems
- Tapping mode versus non-contact mode imaging
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