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NC-AFM2006

9th International Conference on Non-Contact Atomic Force Microscopy
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Scope

       Atomic Force Microscopy (AFM) is a unique and very versatile scanning probe microscopy based on a mechanical detection method. The Non-Contact Atomic Force Microscopy (NC-AFM) - one of the several AFM implementations - is a highly-sensitive and high-resolution technique with which the following feats have been achieved:
  • True atomic resolution in metal, semiconductor and insulating surfaces.
  • The measurement of atomic forces, so-called atomic force spectroscopy.
  • The chemical identification of atoms and molecules.
  • The measurement of the mechanical response of single atoms and molecules.
  • The mechanical manipulation of individual atoms.
  • Mechanical assembly and artificial nanostructuring atom by atom.
       The special characteristics of NC-AFM have been only reached in ultra-high vacuum environment, however molecular and sub-molecular resolution is now also possible even in liquid environment as well as ambient conditions.

       Topics of the conference are:
  1. Instrumentation and techniques
  2. Atomic resolution imaging on insulating substrates, semiconductors, and metals
  3. Atomic resolution imaging on molecular systems
  4. Highest resolution imaging on bio-molecules
  5. Atomic scale manipulation and assembly of nanostructures
  6. Imaging and spectroscopy in liquid environment
  7. Theoretical analysis of contrast mechanisms
  8. Measuring tip-sample interaction potentials and mapping force fields
  9. Characterization and modification of force microscopy tips at the atomic scale
  10. Mechanisms for damping and energy dissipation
  11. Measuring nanoscale charges, work function, and magnetic properties
  12. Simulation of images and virtual SFM systems
  13. Tapping mode versus non-contact mode imaging

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