167 Committee satellite workshop on SPM


We invite all participants of NC-AFM2010 conference to the scientific program of the 167 Committee satellite workshop.


Invited Speakers & Titles


4th Aug (Wed)
Imaging of Interfaces in Liquids and Applications to Biomimetic Materials

14:00-14:30
Zero phase mode atomic force microscopy
L. Pham Van
CEA/DSM/IRAMIS/SPCSI, France

14:30-15:00
New techniques for AFM based force measurement
Sean O'Shea
Institute of Materials Research and Engineering, Singapore

15:00-15:30
Combined atomic force-scanning electrochemical microscopy: nanoelectrochemistry at the AFM-Tip
Christine Kranz
Institute of Analytical and Bioanalytical Chemistry, University of Ulm


Break


15:45-16:05
Atomic resolution observation of soluble crystals in liquid by frequency-modulation AFM
Ken Nagashima
Osaka University, Japan

16:05-16:25
Organization and AFM observation of photosynthetic membrane proteins assembly in planar lipid bilayer
Takehisa Dewa
Graduate School of Engineering, Nagoya Institute of Technology

16:25-16:45
Subnanometer-resolution FM-AFM imaging of biological systems in liquid
Takeshi Fukuma
Frontier Science Organization, Kanazawa University

Break

167 Committee Award Talks
17:00-17:20
Watching protein dynamics in action with high-speed AFM
Takayuki Uchihashi
Kanazawa University, Japan

17:20-17:40
Dynamic structural changes in single receptor protein observed with fast-scanning atomic force
microscopy
Youichi Shinozaki
NTT Basic Research Laboratories, Japan

17:40-18:00
Small amplitude mono- and bi-modal dynamic force microscopy/spectroscopy for vertical and lateral force detections
Shigeki Kawai
University of Basel, Switzerland

18:15
Banquet: (This is different from the one for NCAFM2010 on 3rd Aug.)
               3,500  JPY for each



5th Aug (Thu)
Fundamental standardization for AFM
9:10-9:40
Nanoscale dimensional metrology and standardisation
Gaoliang Dai(Germany), PTB

9:40-10:00
Calibration of dynamic sensors for noncontact-atomic force microscopy
Gordon A. Shaw III, PhD

10:00-10:30
Drift measurement of SPM
Huang(China)


AFM probe and Image reconstruction
10:30-11:00
Improved methods, interlaboratory comparison and standardization
of AFM cantilever spring constant calibration
Charles Clifford, NPL(UK)

11:00-11:30
Probe artifacts and image reconstruction
D. Fujita(Japan), NIMS


Break with lunch


Standardization of various nano-probe technology
12:00-12:30
Characterization of soft materials
Jun Hu(China), Shanhai Institute of Applied Physics
Shanhai institute of Applied Physics, China

12:30-13:00
Standardization of nanoscale optical microscopy"
Jeongyong Kim(Korea)

13:00-13:20
Dr. Mitsui

13:20-13:25 Closing Remark








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